
(1)在试产初期,该款芯片的




①求批次


②第四道工序中智能自动检测为次品的芯片会被自动淘汰,合格的芯片进入流水线并由工人进行抽查检验.已知批次


(2)已知某批次芯片的次品率为



















附:

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同类型试题

y = sin x, x∈R, y∈[–1,1],周期为2π,函数图像以 x = (π/2) + kπ 为对称轴
y = arcsin x, x∈[–1,1], y∈[–π/2,π/2]
sin x = 0 ←→ arcsin x = 0
sin x = 1/2 ←→ arcsin x = π/6
sin x = √2/2 ←→ arcsin x = π/4
sin x = 1 ←→ arcsin x = π/2


y = sin x, x∈R, y∈[–1,1],周期为2π,函数图像以 x = (π/2) + kπ 为对称轴
y = arcsin x, x∈[–1,1], y∈[–π/2,π/2]
sin x = 0 ←→ arcsin x = 0
sin x = 1/2 ←→ arcsin x = π/6
sin x = √2/2 ←→ arcsin x = π/4
sin x = 1 ←→ arcsin x = π/2

